• DocumentCode
    472039
  • Title

    Threshold Optimization of Adaptive Template Filtering for MRI Based on Intelligent Optimization Algorithm

  • Author

    Guo, Lei ; Wu, Youxi ; Liu, Xuena ; Li, Ying ; Xu, Guizhi ; Yan, Weili

  • Author_Institution
    Joint Key Lab. of Electromagn. Field & Electr. Apparatus Reliability, Hebei Univ. of Technol., Tianjin
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    4763
  • Lastpage
    4766
  • Abstract
    Intelligent Optimization Algorithm (IOA) mainly includes Immune Algorithm (IA) and Genetic Algorithm (GA). One of the most important characteristics of MRI is the complicated changes of gray level. Traditional filtering algorithms are not fit for MRI. Adaptive Template Filtering Method (ATFM) is an appropriate denoising method for MRI. However, selecting threshold for ATFM is a complicated problem which directly affects the denoising result. Threshold selection has been based on experience. Thus, it was lack of solid theoretical foundation. In this paper, 2 kinds of IOA are proposed for threshold optimization respectively. As our experiment demonstrates, they can effectively solve the problem of threshold selection and perfect ATFM. Through algorithm analysis, the performance of IA surpasses the performance of GA. As a new kind of IOA, IA exhibits its great potential in image processing
  • Keywords
    adaptive filters; artificial immune systems; biomedical MRI; filtering theory; genetic algorithms; image denoising; medical image processing; MRI; adaptive template filtering method; denoising method; genetic algorithm; image processing; immune algorithm; intelligent optimization algorithm; threshold optimization; Adaptive filters; Algorithm design and analysis; Filtering algorithms; Genetic algorithms; Image analysis; Image processing; Magnetic resonance imaging; Noise reduction; Performance analysis; Solids;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260331
  • Filename
    4462866