DocumentCode
472076
Title
Analysis of a Gain Control Model of V1: Is the Goal Redundancy Reduction?
Author
Shi, Jianing ; Wielaard, Jim ; Sajda, Paul
Author_Institution
Dept. of Biomed. Eng., Columbia Univ., New York, NY
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
4991
Lastpage
4994
Abstract
In this paper we analyze a popular divisive normalization model of V1 with respect to the relationship between its underlying coding strategy and the extraclassical physiological responses of its constituent modeled neurons. Specifically we are interested in whether the optimization goal of redundancy reduction naturally leads to reasonable neural responses, including reasonable distributions of responses. The model is trained on an ensemble of natural images and tested using sinusoidal drifting gratings, with metrics such as suppression index and contrast dependent receptive field growth compared to the objective function values for a sample of neurons. We find that even though the divisive normalization model can produce "typical" neurons that agree with some neurophysiology data, distributions across samples do not agree with experimental data. Our results suggest that redundancy reduction itself is not necessarily causal of the observed extraclassical receptive field phenomena, and that additional optimization dimensions and/or biological constraints must be considered
Keywords
Gaussian distribution; cellular biophysics; neurophysiology; normal distribution; redundancy; vision; extraclassical physiological response; gain control model; neural response; neurophysiology data; normalization model; receptive field growth; redundancy reduction; sinusoidal drifting gratings; suppression index; Biological information theory; Biomedical engineering; Circuits; Cities and towns; Computational modeling; Constraint optimization; Gain control; Image coding; Neurons; Neurophysiology;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.259749
Filename
4462923
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