• DocumentCode
    472125
  • Title

    Real-Time Ocular Artifacts Suppression from EEG Signals Using an Unsupervised Adaptive Blind Source Separation

  • Author

    Shayegh, Farzaneh ; Erfanian, Abbas

  • Author_Institution
    Dept. of Biomed. Eng., Iran Univ. of Sci. & Technol., Tehran
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    5269
  • Lastpage
    5272
  • Abstract
    Independent component analysis (ICA) has been shown to be a powerful tool for artifactual suppression from electroencephalogram (EEG) recordings. However, the real-time application of this method for artifact rejection has not been considered so far. This article presents a method based on an unsupervised, self-normalizing, adaptive learning algorithm for on-line blind source separation. Simulation results are provided to show the validity and effectiveness of the technique with different distributions. The results from real-data demonstrate that the proposed scheme removes perfectly eye blink and eye movement artifacts from the EEG signals and is suitable for use during on-line EEG monitoring such as EEG-based brain computer interface
  • Keywords
    adaptive signal processing; blind source separation; electroencephalography; independent component analysis; medical signal processing; neural nets; unsupervised learning; EEG signals; EEG-based brain computer interface; ICA; adaptive learning algorithm; artifact rejection; eye blink; eye movement artifacts; independent component analysis; neural nets; on-line EEG monitoring; real-time ocular artifacts suppression; self-normalization; unsupervised adaptive blind source separation; Blind source separation; Brain modeling; Cities and towns; Electroencephalography; Electrooculography; Independent component analysis; Multi-layer neural network; Noise cancellation; Sensor arrays; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.259611
  • Filename
    4462993