• DocumentCode
    472212
  • Title

    Statistical Framework for Quantitative Analysis of Array CGH

  • Author

    Shah, Shishir

  • Author_Institution
    Dept. of Comput. Sci., Houston Univ., TX
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    5806
  • Lastpage
    5809
  • Abstract
    Over the last several years there has been an explosion of microarray technology in the biosciences, medical sciences, biotechnology, and pharmaceutical industry. The technology has centered on providing a platform for determining the gene expression profiles of hundreds to tens of thousands of genes (or transcript levels of RNA species) in tissue, tumors, cells, or biological fluids in a single experiment. In recent years, this technology has been extended to include the use of microarrays to study genomic DNA for gains and losses of chromosomal regions. This has become possible through the attachment of large genomic fragments such as BACs (bacterial artificial chromosomes). In this paper, we present a methodology to model a CGH (comparative genomic hybridization) profile as a statistical process and solve for distribution parameters to determine genomic changes across the genome, including whole chromosome gains and losses, and focal point variations that are commonly seen in solid tumors and genetic disorders
  • Keywords
    DNA; biological techniques; cellular biophysics; genetics; molecular biophysics; statistical analysis; RNA species; bacterial artificial chromosomes; chromosomal region; comparative genomic hybridization; focal point variations; gene expression profile; genetic disorders; genomic DNA; genomic changes; microarray technology; quantitative analysis; solid tumors; statistical framework; Bioinformatics; Biological cells; Biological tissues; Biotechnology; Explosions; Gene expression; Genomics; Neoplasms; Pharmaceutical technology; RNA;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.259843
  • Filename
    4463127