DocumentCode :
472272
Title :
Magnetoencephalogram background activity analysis in Alzheimer´s disease patients using auto mutual information
Author :
Gomez, Carlos ; Hornero, Roberto ; Fernandez, Alberto ; Abasolo, Daniel ; Escudero, Javier ; Lopez, Miguel
Author_Institution :
E. T. S. Ingenieros de Telecomunicacion, Valladolid Univ.
fYear :
2006
fDate :
Aug. 30 2006-Sept. 3 2006
Firstpage :
6181
Lastpage :
6184
Abstract :
The goal of this study was to analyze the magnetoencephalogram (MEG) background activity in patients with Alzheimer´s disease (AD) using the auto mutual information (AMI). Applied to time series, AMI provides a measure of future points predictability from past points. Five minutes of recording were acquired with a 148-channel whole-head magnetometer (MAGNES 2500 WH, 4D neuroimaging) in 12 patients with probable AD and 12 elderly control subjects. Artifact-free epochs of 20 seconds (3392 points, sample frequency of 169.6 Hz) were selected for our study. Our results showed that the absolute values of the averaged decline rate of AMI were lower in AD patients than in control subjects for all channels. In addition, there were statistically significant differences (p<0.01, Student´s t-test) in most channels. These preliminary results suggest that neuronal dysfunction in AD is associated with differences in the dynamical processes underlying the MEG recording
Keywords :
diseases; magnetoencephalography; magnetometers; neurophysiology; statistical analysis; 20 s; 4D neuroimaging; 5 mins; Alzheimer disease; MAGNES 2500 WH; MEG recording; auto mutual information; dynamical processes; magnetoencephalogram background activity analysis; neuronal dysfunction; statistical analysis; student t-test; whole-head magnetometer; Alzheimer´s disease; Ambient intelligence; Frequency; Information analysis; Magnetic analysis; Magnetometers; Mutual information; Neuroimaging; Senior citizens; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
ISSN :
1557-170X
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2006.260317
Filename :
4463220
Link To Document :
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