• DocumentCode
    47246
  • Title

    Effects of Random Circuit Fabrication Errors on the Mean and Standard Deviation of Small Signal Gain and Phase of a Traveling Wave Tube

  • Author

    Rittersdorf, I.M. ; Antonsen, Thomas M. ; Chernin, D. ; Lau, Y.Y.

  • Author_Institution
    Univ. of Michigan, Ann Arbor, MI, USA
  • Volume
    1
  • Issue
    5
  • fYear
    2013
  • fDate
    May-13
  • Firstpage
    117
  • Lastpage
    128
  • Abstract
    Random fabrication errors may have detrimental effects on the performance of traveling wave tubes (TWTs) of all types, especially in the sub-millimeter wavelength regime and beyond. Previous studies calculated the standard deviation of the small signal gain and the output phase of a TWT in the presence of small random, axially varying perturbations in the circuit phase velocity, assuming synchronous interaction and zero AC space charge effects. This paper relaxes the latter assumptions. In addition, we calculate the ensemble-average gain and the ensemble-average phase that result from random axial variations in the circuit phase velocity, using two analytic approaches. One is a perturbative approach including all three modes of the coupled beam-circuit equations. The other treats the evolution of only the dominant (exponentially growing) mode. The analytical results on the expected gain and phase compare favorably with results from numerical integrations of the governing equation in the absence of space charge, but are found to deviate from the numerical integrations with the inclusion of space charge effects. The effects of small pitch errors in a 210 GHz folded waveguide TWT are evaluated in an example.
  • Keywords
    Riccati equations; millimetre wave tubes; space charge; travelling wave tubes; waveguides; Riccati equation methods; analytic approaches; circuit phase velocity; coupled beam-circuit equations; ensemble-average gain; ensemble-average phase; folded waveguide TWT; frequency 210 GHz; governing equation; mean deviation; perturbative approach; random axial variations; random circuit fabrication error effect; second-order perturbation analysis; small pitch error effect; small signal gain; standard deviation; submillimeter wavelength; synchronous interaction; traveling wave tube phase; zero AC space charge effects; Electron tubes; Equations; Fabrication; IEEE Electron Devices Society; Mathematical model; Space charge; Standards; Gain variation; fabrication tolerance; phase variation; traveling wave tube;
  • fLanguage
    English
  • Journal_Title
    Electron Devices Society, IEEE Journal of the
  • Publisher
    ieee
  • ISSN
    2168-6734
  • Type

    jour

  • DOI
    10.1109/JEDS.2013.2273794
  • Filename
    6562771