DocumentCode :
472630
Title :
Gate Oxide Thinning Limit Influenced by Gate Materials
Author :
Itsumi, Manabu ; Muramoto, Susumu
Author_Institution :
Atsugi Electrical Communication Laboratory, NTT Atsugi-shi, Kanagawa, 243-01, Japan
fYear :
1985
fDate :
14-16 May 1985
Firstpage :
22
Lastpage :
23
Abstract :
N-type poly Si has no serious influence on thin oxides down to about 30 Ã…. For a boron-doped poly-Si gate, however, current increase characterized by negative gate bias is found. For an Mo gate, gate oxide surface layer of about 20 Ã… next to the gate are deteriorated. By minimizing boron diffusion from a boron-doped poly-Si and Mo penetration during Mo gate formation, both gates will be of practical use for thin gate oxide down to near 30 Ã….
Keywords :
Annealing; Boron; CMOS technology; Electrodes; Electrons; MOS capacitors; Silicon; Thickness measurement; Tunneling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 1985. Digest of Technical Papers. Symposium on
Conference_Location :
Kobe, Japan
Print_ISBN :
4-930813-09-3
Type :
conf
Filename :
4480284
Link To Document :
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