Title :
Comparison of DRAM Cells in the Simulation of Soft Error Rates
Author :
Ando, S. ; Taguchi, M. ; Nakamura, T.
Author_Institution :
Fujitsu Laboratories Ltd. 1677 Ono, Atsugi, Japan 243-01
Keywords :
Alpha particles; Capacitors; Doping; Error analysis; Laboratories; Large-scale systems; Particle tracking; Probability; Random access memory; Shape;
Conference_Titel :
VLSI Technology, 1985. Digest of Technical Papers. Symposium on
Conference_Location :
Kobe, Japan
Print_ISBN :
4-930813-09-3
