DocumentCode

472662

Title

Comparison of DRAM Cells in the Simulation of Soft Error Rates

Author

Ando, S. ; Taguchi, M. ; Nakamura, T.

Author_Institution

Fujitsu Laboratories Ltd. 1677 Ono, Atsugi, Japan 243-01

fYear

1985

fDate

14-16 May 1985

Firstpage

90

Lastpage

91

Keywords

Alpha particles; Capacitors; Doping; Error analysis; Laboratories; Large-scale systems; Particle tracking; Probability; Random access memory; Shape;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, 1985. Digest of Technical Papers. Symposium on

Conference_Location

Kobe, Japan

Print_ISBN

4-930813-09-3

Type

conf

Filename

4480318