• DocumentCode
    472663
  • Title

    An Effect of Filler-Induced-Stress to DRAM Sense Amplifier

  • Author

    Arimoto, K. ; Yamagata, T. ; Miyamoto, H. ; Mashiko, K. ; Yamada, M. ; Sato, S. ; Shibata, H.

  • Author_Institution
    LSI R & D Laboratory, Mitsubishi Electric Corporation 4-1 Mizuhara, Itami 664 Japan
  • fYear
    1985
  • fDate
    14-16 May 1985
  • Firstpage
    92
  • Lastpage
    93
  • Keywords
    Circuits; Coatings; Grain size; Internal stresses; Plastic packaging; Random access memory; Residual stresses; Scanning electron microscopy; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1985. Digest of Technical Papers. Symposium on
  • Conference_Location
    Kobe, Japan
  • Print_ISBN
    4-930813-09-3
  • Type

    conf

  • Filename
    4480319
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=472663