• DocumentCode
    472733
  • Title

    Photo Cleaning of Si Surface after Reactive Ion Etching

  • Author

    Ikawa, E. ; Sugito, S. ; Aoto, N. ; Kurogi, Y.

  • Author_Institution
    Microelectronics Research Laboratories, NEC Corporation 1-1, Miyazaki 4-chome, Miyamae-ku, Kawasaki 213, Japan
  • fYear
    1987
  • fDate
    22-23 May 1987
  • Firstpage
    27
  • Lastpage
    28
  • Keywords
    Dry etching; Mercury (metals); Plasma applications; Semiconductor films; Substrates; Sulfur hexafluoride; Surface cleaning; Surface contamination; Surface morphology; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1987. Digest of Technical Papers. Symposium on
  • Conference_Location
    Karuizawa, Japan
  • Type

    conf

  • Filename
    4480405