472738

Soft-Error Immune Switched-Load-Resistor Memory Cell

Homma, Noriyuki ; Nakamura, Tohru ; Hayashida, Tetsuya ; Matsumoto, Motoaki ; Nakazato, Kazuo ; Onai, Takahiro ; Tamaki, Youichi ; Namba, Mitsuo ; Sagara, Kazuhiko ; Ikeda, Kiyoji

Central Research Laboratory, Hitachi Ltd, Kokubunji, Tokyo 185

1987

22-23 May 1987

37

38

Capacitance; Electrons; Isolation technology; Laboratories; Noise generators; Noise reduction; Random access memory; Read-write memory; Silicon; Voltage;

English

ieee

VLSI Technology, 1987. Digest of Technical Papers. Symposium on

Karuizawa, Japan

conf

4480410