• DocumentCode
    472794
  • Title

    Modeling and Control of Alpha-Particle Effects in Scaled-Down VLSI Circuits

  • Author

    Dennard, R.H. ; Sai-Halasz, G.A. ; Wordeman, M.R.

  • Author_Institution
    IBM, T.J. Watson Research Center P. O. Box 218, Yorktown Hts., N. Y. 10598
  • fYear
    1981
  • fDate
    9-11 Sept. 1981
  • Firstpage
    44
  • Lastpage
    45
  • Keywords
    Circuit simulation; Circuit testing; DRAM chips; Integrated circuit modeling; Ionizing radiation; Predictive models; Protection; Read-write memory; Solid modeling; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1981. Digest of Technical Papers. Symposium on
  • Conference_Location
    Maui, HI, USA
  • Type

    conf

  • Filename
    4480517
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=472794