472800

An N-Well CMOS RAM for High Density Dynamic Memory

Masuda, H. ; Kamigaki, Y. ; Shimohigashi, K. ; Hashimoto, N. ; Arai, E.

Hitachi Central Research Laboratory, Kokubunji, Tokyo, Japan

1981

9-11 Sept. 1981

56

57

Character generation; Circuits; DRAM chips; Dielectric breakdown; Electrons; Laboratories; MOS devices; Random access memory; Read-write memory; Telegraphy;

English

ieee

VLSI Technology, 1981. Digest of Technical Papers. Symposium on

Maui, HI, USA

conf

4480523