Title :
A Versatile Multilevel Metallisation Technology for VLSI Applications
Author :
Perkins, K.D. ; Maleham, J. ; Rhodes, S.J. ; Boys, D.R.
Author_Institution :
Plessey Research (Caswell) Ltd. Allen Clark Research Centre, Caswell, Towcester, Northants, England
Keywords :
Coatings; Electromigration; Etching; Insulation testing; Integrated circuit interconnections; Metallization; Polyimides; Production; Resists; Very large scale integration;
Conference_Titel :
VLSI Technology, 1981. Digest of Technical Papers. Symposium on
Conference_Location :
Maui, HI, USA