• DocumentCode
    472821
  • Title

    Technology Challenges for CMOS VLSI

  • Author

    CMOS Development Team

  • Author_Institution
    Texas Instruments Inc. Dallas, Texas 75265 USA
  • fYear
    1982
  • fDate
    1-3 Sept. 1982
  • Firstpage
    2
  • Lastpage
    5
  • Keywords
    CMOS process; CMOS technology; Degradation; Instruments; MOS devices; MOSFETs; Production; Read only memory; Transistors; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1982. Digest of Technical Papers. Symposium on
  • Conference_Location
    Oiso, Japan
  • Type

    conf

  • Filename
    4480551
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=472821