DocumentCode
472856
Title
An Imaging Device as a VLSI
Author
Terui, Y. ; Yoshino, M. ; Nakayama, M. ; Kugimiya, K. ; Akiyama, S.
Author_Institution
Semiconductor Research Laboratory Matsushita Electric Industrial Company, Ltd. Moriguchi, Osaka 570, Japan
fYear
1982
fDate
1-3 Sept. 1982
Firstpage
82
Lastpage
83
Keywords
Annealing; Dark current; Electrons; Intrusion detection; Laboratories; Noise figure; Semiconductor device noise; Stacking; Temperature; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 1982. Digest of Technical Papers. Symposium on
Conference_Location
Oiso, Japan
Type
conf
Filename
4480587
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