Title :
High Performance Bipolar LSIs; Their Present Status and Future
Author :
Higuchi, H. ; Anzai, A. ; Homma, N. ; Hayasaka, A.
Author_Institution :
Central Research Laboratory, Hitachi Ltd., Kokubunji-shi, Tokyo, 185 Japan
Keywords :
Circuits; Conductivity; Delay effects; Doping; Large scale integration; Logic devices; Parasitic capacitance; Power dissipation; Random access memory; Resistors;
Conference_Titel :
VLSI Technology, 1982. Digest of Technical Papers. Symposium on
Conference_Location :
Oiso, Japan
