Title :
CHMOS - The Emerging VLSI Technology
Author_Institution :
Intel Corporation Aloha, Oregon 97007
Keywords :
Boron; CMOS process; CMOS technology; Charge carrier processes; Circuit testing; Ionization; MOS devices; Protection; Random access memory; Very large scale integration;
Conference_Titel :
VLSI Technology, 1983. Digest of Technical Papers. Symposium on
Conference_Location :
Maui, HI, USA
Print_ISBN :
4-930813-05-0
