472890

Operation of Bulk CMOS Devices at Very Low Temperatures

Hanamura, S. ; Aoki, M. ; Masuhara, T. ; Minato, O. ; Sakai, Y. ; Hayashida, T.

Central Research Laboratory, Hitachi Ltd. Kokubunji, Tokyo 185, Japan

1983

13-15 Sept. 1983

46

47

CMOS logic circuits; Electrical resistance measurement; Inverters; Laboratories; MOS devices; Performance evaluation; Temperature measurement; Threshold voltage; Transconductance; Very large scale integration;

English

ieee

VLSI Technology, 1983. Digest of Technical Papers. Symposium on

Maui, HI, USA

4-930813-05-0

conf

4480630