• DocumentCode
    472890
  • Title

    Operation of Bulk CMOS Devices at Very Low Temperatures

  • Author

    Hanamura, S. ; Aoki, M. ; Masuhara, T. ; Minato, O. ; Sakai, Y. ; Hayashida, T.

  • Author_Institution
    Central Research Laboratory, Hitachi Ltd. Kokubunji, Tokyo 185, Japan
  • fYear
    1983
  • fDate
    13-15 Sept. 1983
  • Firstpage
    46
  • Lastpage
    47
  • Keywords
    CMOS logic circuits; Electrical resistance measurement; Inverters; Laboratories; MOS devices; Performance evaluation; Temperature measurement; Threshold voltage; Transconductance; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1983. Digest of Technical Papers. Symposium on
  • Conference_Location
    Maui, HI, USA
  • Print_ISBN
    4-930813-05-0
  • Type

    conf

  • Filename
    4480630
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=472890