DocumentCode :
472894
Title :
Latch-Up Elimination in High Density CMOS
Author :
Chen, John Y.
Author_Institution :
Hughes Research Laboratories 3011 Malibu Canyon Road Malibu, CA 90265
fYear :
1983
fDate :
13-15 Sept. 1983
Firstpage :
54
Lastpage :
55
Keywords :
Annealing; CMOS process; CMOS technology; Circuits; Doping; FETs; Furnaces; Implants; Laboratories; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 1983. Digest of Technical Papers. Symposium on
Conference_Location :
Maui, HI, USA
Print_ISBN :
4-930813-05-0
Type :
conf
Filename :
4480634
Link To Document :
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