DocumentCode
472901
Title
CR Isolated Cell for Soft Error Prevention -Static RAM Application
Author
Iizuka, Tetsuya ; Sakurai, Takayasu
Author_Institution
Semiconductor Device Engineering Laboratory Toshiba Corporation 1-Komukai Toshiba, Saiwai-ku Kawasaki 210 Japan 81-44-511-2111 ex 2676
fYear
1983
fDate
13-15 Sept. 1983
Firstpage
70
Lastpage
71
Keywords
Chromium; Current supplies; Data engineering; Electrodes; Laboratories; Pulse generation; Random access memory; Read-write memory; Resistors; Semiconductor devices;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 1983. Digest of Technical Papers. Symposium on
Conference_Location
Maui, HI, USA
Print_ISBN
4-930813-05-0
Type
conf
Filename
4480641
Link To Document