DocumentCode :
472901
Title :
CR Isolated Cell for Soft Error Prevention -Static RAM Application
Author :
Iizuka, Tetsuya ; Sakurai, Takayasu
Author_Institution :
Semiconductor Device Engineering Laboratory Toshiba Corporation 1-Komukai Toshiba, Saiwai-ku Kawasaki 210 Japan 81-44-511-2111 ex 2676
fYear :
1983
fDate :
13-15 Sept. 1983
Firstpage :
70
Lastpage :
71
Keywords :
Chromium; Current supplies; Data engineering; Electrodes; Laboratories; Pulse generation; Random access memory; Read-write memory; Resistors; Semiconductor devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 1983. Digest of Technical Papers. Symposium on
Conference_Location :
Maui, HI, USA
Print_ISBN :
4-930813-05-0
Type :
conf
Filename :
4480641
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=472901
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