• DocumentCode
    472917
  • Title

    Hot-Carrir Effects in Submicron VLSIs

  • Author

    Takada, Eiji ; Kume, Hitoshi ; Yoshinobu ; Suzuki, Norio ; Asai, Shojiro ; Hagiwara, Takaaki

  • Author_Institution
    Central Research Laboratory, Hitachi Ltd., Kokubunji, Tokyo 185, Japan
  • fYear
    1983
  • fDate
    13-15 Sept. 1983
  • Firstpage
    104
  • Lastpage
    105
  • Keywords
    Current measurement; Degradation; Hot carrier effects; Hot carrier injection; Hot carriers; Impact ionization; Stress; Temperature dependence; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1983. Digest of Technical Papers. Symposium on
  • Conference_Location
    Maui, HI, USA
  • Print_ISBN
    4-930813-05-0
  • Type

    conf

  • Filename
    4480658
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=472917