• DocumentCode
    472923
  • Title

    VLSI Design for Testability

  • Author

    McCluskey, E.J.

  • Author_Institution
    Center for Reliable Computing Computer Systems Laboratory Depts. of Comp. Sci. and Elec. Eng. Stanford University
  • fYear
    1984
  • fDate
    10-12 Sept. 1984
  • Firstpage
    2
  • Lastpage
    5
  • Keywords
    Circuit testing; Controllability; Design for testability; Integrated circuit testing; Observability; Pins; Semiconductor device measurement; Signal design; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1984. Digest of Technical Papers. Symposium on
  • Conference_Location
    San Diego, CA, USA
  • Print_ISBN
    4-930813-08-5
  • Type

    conf

  • Filename
    4480672
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=472923