• DocumentCode
    472932
  • Title

    Wiring Capacitance Simulation in Two and Three Dimensions

  • Author

    Fukuma, Masao ; Uebbing, Reinhold H.

  • Author_Institution
    Microelectronics Res. Labs. NEC Corporation 4-1-1 Miyazaki, Miyamae-ku, Kawasaki, Japan
  • fYear
    1984
  • fDate
    10-12 Sept. 1984
  • Firstpage
    24
  • Lastpage
    25
  • Keywords
    Circuit simulation; Dielectrics; Mesh generation; Microelectronics; National electric code; Parasitic capacitance; Poisson equations; Very large scale integration; Wire; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1984. Digest of Technical Papers. Symposium on
  • Conference_Location
    San Diego, CA, USA
  • Print_ISBN
    4-930813-08-5
  • Type

    conf

  • Filename
    4480681
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=472932