• DocumentCode
    472958
  • Title

    Small Geometry MOS Transistor Measurements and Observed Short and Narrow Channel Effects

  • Author

    Iwai, H. ; Oristian, J. ; Walker, J. ; Dutton, R.

  • Author_Institution
    Integrated Circuits Laboratory, Stanford University Stanford, California 94305
  • fYear
    1984
  • fDate
    10-12 Sept. 1984
  • Firstpage
    78
  • Lastpage
    79
  • Keywords
    Capacitance measurement; Circuit testing; Computational geometry; Integrated circuit measurements; Laboratories; MOSFETs; Parasitic capacitance; Pulse amplifiers; Pulse measurements; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1984. Digest of Technical Papers. Symposium on
  • Conference_Location
    San Diego, CA, USA
  • Print_ISBN
    4-930813-08-5
  • Type

    conf

  • Filename
    4480708
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=472958