DocumentCode :
472962
Title :
Hot-Electron Substrate Current Generation During Switching Transients
Author :
Hsu, Fu-Chieh ; Chiu, Kuang Yi
Author_Institution :
Hewlett-Packard Laboratories Palo Alto, CA 94304
fYear :
1984
fDate :
10-12 Sept. 1984
Firstpage :
86
Lastpage :
87
Keywords :
Character generation; DC generators; Inverters; Laboratories; Predictive models; Pulse measurements; Switching circuits; Threshold voltage; Time measurement; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 1984. Digest of Technical Papers. Symposium on
Conference_Location :
San Diego, CA, USA
Print_ISBN :
4-930813-08-5
Type :
conf
Filename :
4480712
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=472962
بازگشت