Title :
The Comparison of T/RX Switch Performance for UWB Communication
Author :
Lee, Seung-Sik ; Park, Bong-Hyuk ; Jang, Seung-hyun ; Choi, Sang-Sung
Author_Institution :
Electron. & Telecommun. Res. Inst., Daejeon
Abstract :
This paper compares performance of three transmitter/receiver (T/RX) switch structures, which can be included as UWB RF transceiver. They are designed using complementary metal-oxide semiconductor (CMOS) 0.13 um technology and simulated each structure. They can be operated from 3 to 5 GHz and package model are applied for chip on board(COB) test. They have 1.8 dB insertion loss and more than 30 dB isolation at 5 GHz.
Keywords :
CMOS integrated circuits; chip-on-board packaging; transceivers; ultra wideband communication; CMOS technology; RF transceiver; T/RX switch performance; UWB communication; chip on board test; complementary metal-oxide semiconductor; frequency 3 GHz to 5 GHz; loss 1.8 dB; size 0.13 mum; transmitter/receiver switch structures; CMOS technology; Communication switching; Isolation technology; MOS devices; Radio frequency; Semiconductor device packaging; Switches; Transceivers; Transmitters; Ultra wideband communication; CMOS; T/RX switch; UWB; transceiver;
Conference_Titel :
Advanced Communication Technology, 2008. ICACT 2008. 10th International Conference on
Conference_Location :
Gangwon-Do
Print_ISBN :
978-89-5519-136-3
DOI :
10.1109/ICACT.2008.4493795
