• DocumentCode
    473334
  • Title

    SRAM dynamic stability estimation using MPFP

  • Author

    Khalil, DiaaEldin ; Khellah, Muhammad ; Kim, Nam-Sung ; Ismail, Yehea ; Karnik, Tanay ; De, Vivek

  • Author_Institution
    EECS Dept., Northwestern Univ., Evanston, IL
  • fYear
    2007
  • fDate
    29-31 Dec. 2007
  • Firstpage
    167
  • Lastpage
    170
  • Abstract
    In this paper, an accurate approach for estimating SRAM dynamic stability is proposed. The conventional methods of SRAM stability estimation suffer from two major drawbacks: (1) using static failure criteria, such as SNM, which does not capture the transient and dynamic behavior of SRAM operation, and (2) using quasi-Monte-Carlo simulation, which approximates the failure distribution, resulting in large errors at the tails where the desired failure probabilities exist. These drawbacks are eliminated by employing a new distribution-independent, most-probable-failure-point search technique for accurate probability calculation along with accurate simulation-based dynamic failure criteria. Compared to previously published techniques, the proposed technique offers orders of magnitude improvement in accuracy. Moreover, the proposed technique enables the correct evaluation of stability in real operation conditions and for different dynamic circuit techniques, such as dynamic writeback, where the conventional methods are not applicable.
  • Keywords
    Monte Carlo methods; SRAM chips; SRAM dynamic stability estimation; most-probable-failure-point search; probability calculation; quasiMonte-Carlo simulation; simulation-based dynamic failure criteria; Circuit simulation; Circuit stability; Gaussian distribution; Laboratories; Probability distribution; Random access memory; Resource description framework; Sampling methods; Stability criteria; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2007. ICM 2007. Internatonal Conference on
  • Conference_Location
    Cairo
  • Print_ISBN
    978-1-4244-1846-6
  • Electronic_ISBN
    978-1-4244-1847-3
  • Type

    conf

  • DOI
    10.1109/ICM.2007.4497685
  • Filename
    4497685