Title :
Small disturbance voltage stability analysis considering the effect of dynamic load parameters
Author :
Zhang, J.F. ; Tse, C.T. ; Wang, K.W. ; Chung, C.Y.
Author_Institution :
Dept. of Electr. Eng., Hong Kong Polytech. Univ., Kowloon
Abstract :
Small disturbance voltage stability is analyzed on the P-V curve with the exponential recovery dynamic loads. The effect of dynamic load parameters on the analysis result is investigated using probabilistic egienvalues under the assumption that the load parameters are normally distributed. The analysis is tested on a three-machine and nine-bus system. The result shows that the probabilistic analysis is helpful to obtain the correct analysis result if there are uncertainties in load parameters.
Keywords :
eigenvalues and eigenfunctions; power system faults; power system stability; probability; dynamic load parameters; exponential recovery dynamic loads; nine-bus system; probabilistic analysis; probabilistic egienvalues; small disturbance voltage stability analysis; three-machine system; Bifurcation; Eigenvalues and eigenfunctions; Load flow; Load modeling; Power system dynamics; Power system modeling; Power system stability; Stability analysis; Uncertainty; Voltage; Dynamic Load Model; Probabilistic Eigenvalue;
Conference_Titel :
Power Engineering Conference, 2007. IPEC 2007. International
Conference_Location :
Singapore
Print_ISBN :
978-981-05-9423-7
