• DocumentCode
    473906
  • Title

    Evanescent-field Terahertz time-domain microscopy

  • Author

    Cunningham, J. ; Byrne, M. ; Upadhya, P.C. ; Wood, C. ; Dazhang, L. ; Lachab, M. ; Khanna, S.P. ; Linfield, E.H. ; Davies, A.G.

  • Author_Institution
    Sch. of Electron. & Electr. Eng., Leeds Univ., Leeds
  • fYear
    2007
  • fDate
    2-9 Sept. 2007
  • Firstpage
    58
  • Lastpage
    59
  • Abstract
    Several modalities have previously been presented for the sub-wavelength imaging of objects at terahertz (THz) frequencies. An important limitation of many such techniques is that they require intense near-infrared radiation to be focused onto the sample being studied, making them unsuitable for measuring light sensitive specimens such as biological substrates and charge carriers contained within semiconductor microstructures. We present an alternative approach based on evanescent-field THz time-domain spectroscopy using on-chip THz circuits. In this case, a pulsed evanescent THz electric field, extending above an on-chip THz waveguide is used to probe specimens. A lithographically-defined microstrip waveguide restricts the THz electric field laterally, while the exponential decay of the field above the waveguide into free-space provides controllable sub-wavelength penetration into specimens. We present an overview of recent results showing the interaction of pulsed THz evanescent electric fields with semiconductor samples, and discuss how such on-chip THz waveguides present a useful route towards THz microscopy.
  • Keywords
    submillimetre wave imaging; biological substrates; charge carriers; evanescent-field terahertz time-domain microscopy; light sensitive specimens; lithographically-defined microstrip waveguide; near-infrared radiation; semiconductor microstructures; subwavelength imaging; subwavelength penetration; time-domain spectroscopy; Charge carriers; Charge measurement; Current measurement; Focusing; Frequency; Microscopy; Optical imaging; Semiconductor waveguides; Substrates; Time domain analysis; Microscopy; high-frequency measurements; imaging techniques; terahertz spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
  • Conference_Location
    Cardiff
  • Print_ISBN
    978-1-4244-1438-3
  • Type

    conf

  • DOI
    10.1109/ICIMW.2007.4516394
  • Filename
    4516394