Characterization of wire-pair negative index material at terahertz frequencies

Author

Awad, M. ; Nagel, M. ; Kurz, H.

Author_Institution

Inistitute of Semicond. Electron., RWTH Aachen Univ., Aachen

fYear

2007

fDate

2-9 Sept. 2007

Firstpage

340

Lastpage

341

Abstract

In this work, fabrication and characterization of a negative-index metamaterial consisting of free-standing wire-pair composite structures is presented for application at THz frequencies. Complex index of refraction data is derived from amplitude- and phase-sensitive THz time-domain transmission and reflection measurements and compared with theoretical results. A first direct measurement of a negative index of refraction at 0.5 THz is demonstrated.

Keywords

composite materials; metamaterials; refractive index; submillimetre waves; THz time-domain reflection measurements; THz time-domain transmission measurements; frequency 0.5 THz; negative-index metamaterial; refraction index; wire-pair composite structures; wire-pair negative index material; Conducting materials; Dielectric measurements; Fabrication; Frequency measurement; Metamaterials; Optical reflection; Silicon; Surface emitting lasers; Surface waves; Wire; THz-TDS; metamaterials; negative index material;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on

Conference_Location

Cardiff

Print_ISBN

978-1-4244-1438-3

Type

conf

DOI

10.1109/ICIMW.2007.4516524

Filename

4516524