Title :
Self-consistent analytic scattering theory for apertureless THz near-field microscope
Author :
Kim, J. ; Park, H. ; Lee, K. ; Han, H. ; Park, I. ; Lim, H.
Author_Institution :
Pohang Univ. of Sci. & Technol., Pohang
Abstract :
We propose a self-consistent analytic scattering theory for apertureless THz near-field microscope (NFM) which is based on an exact image theory. In this new scattering theory, a quasi-electrostatic image theory is adopted to include the effects of the specular reflection of the incident field and the exact image dipoles induced in the probe tip and the sample substrate. The analytic results from our self-consistent theory are in good agreement with the simulation results obtained by using HFSS, a commercial software based on finite element method.
Keywords :
finite element analysis; microscopes; near-field scanning optical microscopy; scattering; HFSS; apertureless THz near-field microscope; finite element method; image dipoles; incident field; quasielectrostatic image theory; sample substrate; self-consistent analytic scattering theory; self-consistent theory; specular reflection; Atomic force microscopy; Dielectric substrates; Image analysis; Optical imaging; Optical microscopy; Optical reflection; Optical scattering; Particle scattering; Polarization; Probes; Apertureless near-field microscope; Image theory; Scattering theory; Terahertz wave;
Conference_Titel :
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1438-3
DOI :
10.1109/ICIMW.2007.4516599
