Initial results of AM reflectometory on CPD

Author

Idei, Hiroshi ; Kawasaki, Shouji ; Hanada, Kazuaki ; Zushi, Hideki ; Sakamoto, Mizuki ; Hasegawa, Makoto ; Nakashima, Hisatoshi ; Higashijima, Aki ; Wataya, Yuichi ; Matsubara, Shinji ; Kawano, Shuhei ; Matsubara, S. ; Kawano, S.

Author_Institution

Res. Inst. for Appl. Mech., Kyushu Univ., Fukuoka

fYear

2007

fDate

2-9 Sept. 2007

Firstpage

518

Lastpage

519

Abstract

The amplitude modulation reflectometer system has been developed to measure the density profile in detail on the compact PWI (plasma-wall interaction) device (CPD) experiments. The probing frequency range was 6-18 GHz, and its frequency-switching time was 10 mus in an arbitrary step. Using the broadband fast-scanning reflectometer, the wide-range density profile can be measured with high time resolution. In X-mode reflectometory, the developed system successfully measured the phase delay of propagating waves at 6.6, 8.8 and 13.2 GHz, reflected at the vessel wall of the CPD and the R-cutoff layers in the CPD plasma.

Keywords

amplitude modulation; plasma-wall interactions; reflectometry; X-mode reflectometory; amplitude modulation reflectometer; broadband fast-scanning reflectometer; compact PWI device; plasma-wall interaction; probing frequency; Amplitude modulation; Density measurement; Frequency; Phase measurement; Plasma density; Plasma devices; Plasma measurements; Plasma waves; Propagation delay; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on

Conference_Location

Cardiff

Print_ISBN

978-1-4244-1438-3

Type

conf

DOI

10.1109/ICIMW.2007.4516610

Filename

4516610