Title :
Timing yield driven clock skew scheduling considering non-Gaussian distributions of critical path delays
Author :
Wang, Yi ; Luk, Wai-Shing ; Zen, Xuan ; Tao, Jun ; Yan, Changhao ; Tong, Jiarong ; Cai, Wei ; Ni, Jia
Author_Institution :
Microelectron. Dept., Fudan Univ., Shanghai
Abstract :
In nanometer technologies, process variations possess growing nonlinear impacts on circuit performance, which causes critical path delays of combinatorial circuits variate randomly with non-Gaussian distribution. In this paper, we propose a novel clock skew scheduling methodology that optimizes timing yield by handling non-Gaussian distributions of critical path delays. Firstly a general formulation of the optimization problem is proposed, which covers most of the previous formulations and indicates their limitations with statistical interpretations. Then a generalized minimum balancing algorithm is proposed for effectively solving the skew scheduling problem. Experimental results show that the proposed method significantly outperforms some representative methods previously proposed for yield optimization, and could obtain timing yield improvements up to 33.6% and averagely 17.7%.
Keywords :
circuit optimisation; clocks; critical path analysis; integrated circuit yield; clock skew scheduling; critical path delays; generalized minimum balancing algorithm; non-Gaussian distributions; optimization problem; timing yield; yield optimization; Application specific integrated circuits; Circuit optimization; Clocks; Delay effects; Mathematics; Microelectronics; Optimization methods; Safety; Scheduling algorithm; Timing; Clock skew scheduling; Process variations; Yield; non-Gaussian;
Conference_Titel :
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-60558-115-6