• DocumentCode
    474448
  • Title

    Timing yield driven clock skew scheduling considering non-Gaussian distributions of critical path delays

  • Author

    Wang, Yi ; Luk, Wai-Shing ; Zen, Xuan ; Tao, Jun ; Yan, Changhao ; Tong, Jiarong ; Cai, Wei ; Ni, Jia

  • Author_Institution
    Microelectron. Dept., Fudan Univ., Shanghai
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    223
  • Lastpage
    226
  • Abstract
    In nanometer technologies, process variations possess growing nonlinear impacts on circuit performance, which causes critical path delays of combinatorial circuits variate randomly with non-Gaussian distribution. In this paper, we propose a novel clock skew scheduling methodology that optimizes timing yield by handling non-Gaussian distributions of critical path delays. Firstly a general formulation of the optimization problem is proposed, which covers most of the previous formulations and indicates their limitations with statistical interpretations. Then a generalized minimum balancing algorithm is proposed for effectively solving the skew scheduling problem. Experimental results show that the proposed method significantly outperforms some representative methods previously proposed for yield optimization, and could obtain timing yield improvements up to 33.6% and averagely 17.7%.
  • Keywords
    circuit optimisation; clocks; critical path analysis; integrated circuit yield; clock skew scheduling; critical path delays; generalized minimum balancing algorithm; non-Gaussian distributions; optimization problem; timing yield; yield optimization; Application specific integrated circuits; Circuit optimization; Clocks; Delay effects; Mathematics; Microelectronics; Optimization methods; Safety; Scheduling algorithm; Timing; Clock skew scheduling; Process variations; Yield; non-Gaussian;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-60558-115-6
  • Type

    conf

  • Filename
    4555812