• DocumentCode
    474457
  • Title

    Early formal verification of conditional coverage points to identify intrinsically hard-to-verify logic

  • Author

    Ho, C. Richard ; Theobald, Michael ; Deneroff, Martin M. ; Dror, Ron O. ; Gagliardo, Joseph ; Shaw, David E.

  • Author_Institution
    D.E. Shaw Res., New York, NY
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    268
  • Lastpage
    271
  • Abstract
    Design verification of complex digital circuits typically starts only after the register-transfer level (RTL) description is complete. This frequently makes verification more difficult than necessary because logic that is intrinsically hard to verify, such as memories, counters and deep first-in, first-out (FIFO) structures, becomes immutable in the design. This paper proposes a new approach that exploits formal verification of conditional coverage points with the goal of early identification of hard-to-verify logic. We use the difficulty of formal verification problems as an early estimator of the verification complexity of a design. While traditional verification methods consider conditional coverage only in the design verification phase, we describe an approach that uses conditional coverage at a much earlier stage-the design phase, during which changes to the RTL code are still possible. The method is illustrated using real examples from the verification of an ASIC designed for a specialized supercomputer.
  • Keywords
    application specific integrated circuits; formal verification; integrated circuit design; integrated logic circuits; logic design; logic testing; ASIC design; RTL code; complex digital circuit design verification; conditional coverage points; early formal verification; intrinsic hard-to-verify logic identification; register-transfer level description; Analytical models; Application specific integrated circuits; Circuit simulation; Computational modeling; Counting circuits; Digital circuits; Discrete event simulation; Formal verification; Logic circuits; Logic design; Formal verification; code coverage; conditional coverage; coverage hole; inconclusive results; verifiability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-60558-115-6
  • Type

    conf

  • Filename
    4555821