Title :
Analog parallelism in ring-based VCOs
Author :
Kim, Jonghae ; Cho, Choongyeun ; Jonghae Kim
Author_Institution :
SRDC, IBM, Hopewell Junction, NY
Abstract :
The performance advantages in parallel ring-based VCOs are explored. When the number of VCOs is doubled, the parallel VCOs enhance phase noise by 3 dB, and the within-chip process-induced variation is reduced by 3 dB, which improves chip-limited yield. The parallel VCOs trade off circuit area and power in exchange. The parallelism advantages in analog and digital systems are compared.
Keywords :
analogue circuits; parallel processing; voltage-controlled oscillators; analog parallelism; chip-limited yield; parallel ring-based VCOs; phase noise; within-chip process-induced variation; Clocks; Digital systems; Frequency; Inductors; Jitter; Microprocessors; Phase locked loops; Phase noise; Throughput; Voltage-controlled oscillators; Analog parallelism; clock period jitter; microprocessor; phase noise; phase-locked loop; process-induced variation; ring-based voltage-controlled oscillator;
Conference_Titel :
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-60558-115-6
