• DocumentCode
    474482
  • Title

    IFRA: Instruction Footprint Recording and Analysis for post-silicon bug localization in processors

  • Author

    Park, Sung-Boem ; Mitra, Subhasish

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    373
  • Lastpage
    378
  • Abstract
    The objective of IFRA, instruction footprint recording and analysis, is to overcome the challenges associated with a very expensive step in post-silicon validation of processors - bug localization in a system setup. IFRA consists of special design and analysis techniques required to bridge a major gap between system-level and circuit-level debug. Special hardware recorders, called footprint recording structures (FRS´s), record semantic information about data and control flows of instructions passing through various design blocks of a processor. This information is recorded concurrently during normal operation of a processor in a post-silicon system validation setup. Upon detection of a problem, the recorded information is scanned out and analyzed for bug localization. Special program analysis techniques, together with the binary of the application executed during post-silicon validation, are used for the analysis. IFRA does not require full system-level reproduction of bugs or system-level simulation. Simulation results on a complex super-scalar processor demonstrate that IFRA is effective in accurately localizing bugs with very little impact on overall chip area.
  • Keywords
    program debugging; program verification; circuit-level debug; instruction footprint recording and analysis; post-silicon bug localization; post-silicon system validation setup; post-silicon validation; program analysis techniques; semantic information; system-level debug; Analytical models; Bridge circuits; Circuit simulation; Clocks; Computer bugs; Costs; Fault detection; Hardware; Information analysis; Reproducibility of results; Validation; debug; design for debug; verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-60558-115-6
  • Type

    conf

  • Filename
    4555846