DocumentCode :
474524
Title :
Leakage power-aware clock skew scheduling: Converting stolen time into leakage power reduction
Author :
Ni, Min ; Memik, Seda Ogrenci
Author_Institution :
Dept. of EECS, Northwestern Univ., Evanston, IL
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
610
Lastpage :
613
Abstract :
Clock skew scheduling has been traditionally considered as a tool for improving the clock period in a sequential circuit. Timing slack is "stolen" from fast combinational blocks to be used by slower blocks to meet a more stringent clock cycle time. Instead, we can leverage on the borrowed time to achieve leakage power reduction during gate sizing and/or dual Vth assignment. In this paper, we present the first approach to the best of our knowledge for integrating clock skew scheduling, threshold voltage assignment, and gate sizing into one optimization formulation. Over 29 circuits in the ISCAS89 benchmark suite, this integrated approach can reduce leakage power by as much as 55.83% and by 18.79% on average, compared to using combinational circuit based power optimization on each combinational block without considering clock skews. Using a 65 nm dual Vth technology library, this corresponds to a 23.87% peak reduction (6.15% on average) in total power at the ambient operating temperature. The average total power reduction further increases to 9.83% if the high temperature library of the same process technology is used.
Keywords :
clocks; logic gates; optimisation; scheduling; sequential circuits; ISCAS89 benchmark suite; Vth technology library; gate sizing; leakage power reduction; leakage power-aware clock skew scheduling; optimization formulation; sequential circuit; threshold voltage assignment; timing slack; Circuit optimization; Clocks; Combinational circuits; Flip-flops; Integrated circuit technology; Libraries; Sequential circuits; Temperature; Threshold voltage; Timing; Clock skew scheduling; Dual-Vth; Gate sizing; Leakage power optimization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location :
Anaheim, CA
ISSN :
0738-100X
Print_ISBN :
978-1-60558-115-6
Type :
conf
Filename :
4555890
Link To Document :
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