DocumentCode :
474527
Title :
Concurrent topology and routing optimization in automotive network integration
Author :
Lukasiewycz, Martin ; Glass, Michael ; Haubelt, Christian ; Teich, Jurgen ; Regler, Richard ; Lang, Bardo
Author_Institution :
Dept. of Comput. Sci. 12, Univ. of Erlangen, Nuremberg
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
626
Lastpage :
629
Abstract :
In this paper, a novel automatic approach for the concurrent topology and routing optimization that achieves a high quality network layout is proposed. This optimization is based on a specialized binary Integer Linear Program (ILP) in combination with a Multi-Objective Evolutionary Algorithm (MOEA). The ILP is formulated such that each solution represents a topology and routing that fulfills all requirements and demands of the network. Thus, in an iterative process, this ILP is solved to obtain feasible networks whereas the MOEA is used for the optimization of multiple even non-linear objectives and ensures a fast convergence towards the optimal solutions. Additionally, a domain specific preprocessing algorithm for the ILP is presented that decreases the problem complexity and, thus, allows to optimize large and complex networks efficiently. The experimental results validate the performance of this methodology on two state-of-the-art prototype automotive networks.
Keywords :
automotive electronics; evolutionary computation; linear programming; telecommunication network routing; telecommunication network topology; automotive networks; concurrent topology; multi-objective evolutionary algorithm; multiple even nonlinear objectives; network layout; routing optimization; specialized binary Integer Linear Program; Automotive engineering; Communication system control; Complex networks; Computer science; Design optimization; Evolutionary computation; Iterative algorithms; Network topology; Permission; Routing; Automotive; Network Integration; Optimization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location :
Anaheim, CA
ISSN :
0738-100X
Print_ISBN :
978-1-60558-115-6
Type :
conf
Filename :
4555893
Link To Document :
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