DocumentCode :
474557
Title :
On reliable modular testing with vulnerable test access mechanisms
Author :
Huang, Lin ; Yuan, Feng ; Xu, Qiang
Author_Institution :
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong
fYear :
2008
fDate :
8-13 June 2008
Firstpage :
834
Lastpage :
839
Abstract :
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prior work assumes TAMs to be error-free during test data transfer. The validity of this assumption, however, is questionable with the ever-decreasing feature size of today\´s VLSI technology and the ever-increasing circuit operational frequency. In particular, when functional interconnects such as network-on-chip (NoC) are reused as TAMs, even if they have passed manufacturing test beforehand, failures caused by electrical noise such as crosstalk and transient errors may happen during test data transfer and make good chips appear to be defective, thus leading to undesired test yield loss. To address the above problem, in this paper, we propose novel solutions that are able to achieve reliable modular testing even if test data may sometimes get corrupted during transmission with vulnerable TAMs, by designing a new "jitter-aware" test wrapper and a new "jitter-transparent" ATE interface. Experimental results on an industrial circuit demonstrate the effectiveness of the proposed technique.
Keywords :
VLSI; electronic data interchange; integrated circuit reliability; integrated circuit testing; jitter; network-on-chip; transient analysis; VLSI technology; crosstalk; electrical noise; modular testing reliability; network-on-chip; system-on-a-chip; transient errors; transport test data; vulnerable test access mechanisms; Circuit testing; Crosstalk; Frequency; Integrated circuit interconnections; Manufacturing; Network-on-a-chip; Pins; System testing; System-on-a-chip; Very large scale integration; Modular Testing; Reliable Test; Test Access Mechanisms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location :
Anaheim, CA
ISSN :
0738-100X
Print_ISBN :
978-1-60558-115-6
Type :
conf
Filename :
4555935
Link To Document :
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