Title :
Process characterization of experimental photonic one-way quantum computing
Author :
Tokunaga, Yuuki ; Kuwashiro, Shin ; Yamamoto, Takashi ; Koashi, Masato ; Imoto, Nobuyuki
Author_Institution :
NTT Inf. Sharing Platform Labs., NTT Corp., Tokyo
Abstract :
We demonstrate process characterization of basic gates of an optical cluster-state quantum computing. We present complete process tomography of a single-qubit gate and evaluate the bounds on the process fidelity of a two-qubit gate.
Keywords :
quantum gates; optical cluster-state quantum computing; photonic one-way quantum computing; process characterization; process fidelity; process tomography; single-qubit gate; two-qubit gate; Delay; Optical computing; Optical pulses; Optical retarders; Photonic crystals; Physics computing; Polarization; Quantum computing; Quantum entanglement; Tomography; (270.5565) Quantum communications; (270.5585) Quantum information and processing;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
