• DocumentCode
    47533
  • Title

    Spectral Deconvolution and Feature Extraction With Robust Adaptive Tikhonov Regularization

  • Author

    Hai Liu ; Luxin Yan ; Yi Chang ; Houzhang Fang ; Tianxu Zhang

  • Author_Institution
    Sci. & Technol. on Multi-spectral Inf. Process. Lab., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • Volume
    62
  • Issue
    2
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    315
  • Lastpage
    327
  • Abstract
    Raman spectral interpretation often suffers common problems of band overlapping and random noise. Spectral deconvolution and feature-parameter extraction are both classical problems, which are known to be difficult and have attracted major research efforts. This paper shows that the two problems are tightly coupled and can be successfully solved together. Mutual support of Raman spectral deconvolution and feature-extraction processes within a joint variational framework are theoretically motivated and validated by successful experimental results. The main idea is to recover latent spectrum and extract spectral feature parameters from slit-distorted Raman spectrum simultaneously. Moreover, a robust adaptive Tikhonov regularization function is suggested to distinguish the flat, noise, and points, which can suppress noise effectively as well as preserve details. To evaluate the performance of the proposed method, quantitative and qualitative analyses were carried out by visual inspection and quality indexes of the simulated and real Raman spectra.
  • Keywords
    Raman spectroscopy; adaptive signal processing; deconvolution; feature extraction; optical information processing; Raman spectral deconvolution; feature extraction processes; joint variational framework; robust adaptive Tikhonov regularization function; slit distorted Raman spectrum; Deconvolution; Feature extraction; Instruments; Kernel; Noise; Noise measurement; Robustness; Deconvolution; Raman spectroscopy; Tikhonov regularization (TR); feature extraction; peak detection; spectral analysis; variational method;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2012.2217636
  • Filename
    6313911