DocumentCode
475449
Title
Investigation into temperature impact on quasi short-circuit energy losses in CMOS gates
Author
Golda, A. ; Kos, A.
Author_Institution
AGH University of Science and Technology, POLAND
fYear
2008
fDate
19-21 June 2008
Firstpage
331
Lastpage
335
Abstract
In this paper the temperature influence on quasi short-circuit component of energy consumption is investigated. This work takes into account values of zero temperature coefficient points related to supply voltage. The wide range of CMOS technology processes (from 32 nm to 3 μm) is considered.
Keywords
CMOS technology; Capacitance; Energy consumption; Energy loss; Inverters; MOSFETs; Predictive models; Semiconductor device modeling; Temperature; Voltage; CMOS gates; Energy consumption; Temperature;
fLanguage
English
Publisher
iet
Conference_Titel
Mixed Design of Integrated Circuits and Systems, 2008. MIXDES 2008. 15th International Conference on
Conference_Location
Poznan, Poland
Print_ISBN
978-83-922632-7-2
Electronic_ISBN
978-83-922632-8-9
Type
conf
Filename
4600926
Link To Document