DocumentCode :
475449
Title :
Investigation into temperature impact on quasi short-circuit energy losses in CMOS gates
Author :
Golda, A. ; Kos, A.
Author_Institution :
AGH University of Science and Technology, POLAND
fYear :
2008
fDate :
19-21 June 2008
Firstpage :
331
Lastpage :
335
Abstract :
In this paper the temperature influence on quasi short-circuit component of energy consumption is investigated. This work takes into account values of zero temperature coefficient points related to supply voltage. The wide range of CMOS technology processes (from 32 nm to 3 μm) is considered.
Keywords :
CMOS technology; Capacitance; Energy consumption; Energy loss; Inverters; MOSFETs; Predictive models; Semiconductor device modeling; Temperature; Voltage; CMOS gates; Energy consumption; Temperature;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Mixed Design of Integrated Circuits and Systems, 2008. MIXDES 2008. 15th International Conference on
Conference_Location :
Poznan, Poland
Print_ISBN :
978-83-922632-7-2
Electronic_ISBN :
978-83-922632-8-9
Type :
conf
Filename :
4600926
Link To Document :
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