Specialised excitation and wavelet feature extraction in fault diagnosis of analogue electronic circuits

This article presents design of specialised aperiodic excitation. Purpose is fault diagnosis of analogue electronic circuits. The goal is enhancement of parametric (soft) faults location. Such combination is one of the most difficult diagnosis cases. Further improvement is achieved after utilising wavelet transform as a feature extractor. Obtained results are compared with fault diagnosis by means of the simplest aperiodic function: unit step.