Title :
Simulation Research on Workshop Control Strategy in Semiconductor Wafer Probe Area
Author :
Tie-Zhu, Zhang ; Yue-Peng, Wang
Author_Institution :
Economic & Manage. Sch., Harbin Univ. of Sci. & Technol., Harbin
Abstract :
In view of semiconductor wafer probe area´s workshop management and control problem, with the thought of object-oriented, a behavior model of probing workshop is set up in terms of the figuration of UML. Paper puts forward an integrated workshop control strategy considered three factors; wafer releasing speed, dispatching rule and buffer capacity. It uses the SimTalk brought by EM-plant to transform behavior model directly into simulation model. By analyzing the experimental result of simulation model, the influence of the wafer releasing speed, machine dispatching and buffer capacity upon probe performance indicators such as month output, production cycle and quantity of work in process are got. It supplies the decision maker with evidence.
Keywords :
integrated circuit manufacture; production control; production engineering computing; UML; buffer capacity; dispatching rule; integrated workshop control strategy; semiconductor wafer probe area; workshop control strategy; Communication system control; Dispatching; Manufacturing industries; Object oriented modeling; Performance analysis; Probes; Production; Semiconductor device modeling; Technology management; Unified modeling language; EM-plant; Semiconductor wafer probe area; UML; Workshop control strategy;
Conference_Titel :
Computing, Communication, Control, and Management, 2008. CCCM '08. ISECS International Colloquium on
Conference_Location :
Guangzhou
Print_ISBN :
978-0-7695-3290-5
DOI :
10.1109/CCCM.2008.320