Title :
Research on Digital Circuit Fault Location Procedure Based on LASAR
Author :
Wei, Su ; Shide, Zhang ; Lijun, Xue
Author_Institution :
Beijing Union Univ., Beijing
Abstract :
This paper describes LASAR V6 (logic automated stimulus response) that is the software for digital test program to generate fault dictionary used as a diagnosis database of fault isolation for a tested circuit based on fault simulation, presents three core files relating to circuit fault diagnosis which is generated by LASAR, i.e. fault dictionary, node truth table and pin connection table, analyses the content of fault dictionary, pin connection table and node truth table, finds the necessary information for fault location, summarizes the procedure of circuit test and fault location. Finally the digital circuit diagnosis system which can locate the fault on the pin of components is designed. With the help of probe, fault location of component pins can be accurately pinpointed.
Keywords :
circuit reliability; digital circuits; fault diagnosis; logic simulation; logic testing; LASAR; diagnosis database; digital circuit fault location; digital test program; fault isolation; logic automated stimulus response; node truth table; pin connection table; Automatic testing; Circuit faults; Circuit testing; Dictionaries; Digital circuits; Fault diagnosis; Fault location; Logic circuits; Logic testing; Software testing; LASAR; fault diagnosis; fault dictionary;
Conference_Titel :
Computing, Communication, Control, and Management, 2008. CCCM '08. ISECS International Colloquium on
Conference_Location :
Guangzhou
Print_ISBN :
978-0-7695-3290-5
DOI :
10.1109/CCCM.2008.253