Development of PT Secondary Circuit´s Drop Test Instrument Based on dsPIC30F6010 Singlechip

Author

Li, Haiquan ; Zhang, Shuguang ; Zhang, Dening ; Kou, Hongjuan ; Zhang, Shan

Author_Institution

Sch. of Mech. & Electr. Eng., Agric. Univ. of Hebei, Baoding

Volume

2

fYear

2008

fDate

3-4 Aug. 2008

Firstpage

500

Lastpage

504

Abstract

In the comprehensive error of energy metering device, only metering error of voltage drop of TV secondary circuit can be reduced by some technical improvement measures. This paper introduces a portable intellectual instrument used to measure PT secondary drop of voltage transformer based on metering, while relying on dsPIC30F6010 single chip, as well as the form of hardware and procedure of software.

Keywords

electric potential; potential transformers; power measurement; power meters; PT secondary circuit; TV secondary circuit; drop test instrument; dsPIC30F6010 singlechip; energy metering device; portable intellectual instrument; voltage drop; voltage transformer; Cables; Circuit testing; Current measurement; Current transformers; Electric variables measurement; Instruments; Power measurement; Semiconductor device measurement; TV; Voltage transformers; Harvard Construction; PT secondary drop; difference measurement; embedded system; voltage transformer;

fLanguage

English

Publisher

ieee

Conference_Titel

Computing, Communication, Control, and Management, 2008. CCCM '08. ISECS International Colloquium on

Conference_Location

Guangzhou

Print_ISBN

978-0-7695-3290-5

Type

conf

DOI

10.1109/CCCM.2008.267

Filename

4609736