Title :
Expression intensity measurement from facial images by self organizing maps
Author :
Amin, Md Ashraful ; Yan, Hong
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, Hong Kong
Abstract :
Facial expression recognition and inferring emotion from an expression is a challenging task. Many methods have been proposed to recognize facial expressions, but the more challenging task ldquofacial expression intensity classificationrdquo remains less focused. Here we propose a system that is able to provide an estimation of facial expression intensity from facial images. At first each image of these sequences are normalized and cropped based on a fixed template. Then, features are captured from Gabor wavelet transformation of these images followed by principle component analysis (PCA). Finally, self organizing maps (SOM) are applied to determine the intensity of emotion from these principle components. In this work we propose a heuristic; MDC (minimum distance criterion) that is able to provide a quantitative measurement about the goodness of a combination of PCs from the intensity measurement point of view. Moreover, we propose a method to represent the results of SOM in the form of membership functions to visualize the qualitative performance.
Keywords :
emotion recognition; image classification; image sequences; principal component analysis; self-organising feature maps; wavelet transforms; Gabor wavelet transformation; expression intensity measurement; facial expression recognition; facial images; inferring emotion; minimum distance criterion; principle component analysis; self organizing maps; Cybernetics; Emotion recognition; Face recognition; Humans; Image analysis; Image recognition; Information science; Machine learning; Principal component analysis; Self organizing feature maps; Facial expression; Gabor; PCA; SOM; emotional intensity;
Conference_Titel :
Machine Learning and Cybernetics, 2008 International Conference on
Conference_Location :
Kunming
Print_ISBN :
978-1-4244-2095-7
Electronic_ISBN :
978-1-4244-2096-4
DOI :
10.1109/ICMLC.2008.4621008