• DocumentCode
    476645
  • Title

    Mesurements of thin resistive films employing split post dielectric resonator technique

  • Author

    Krupka, Jerzy ; Jacob, Mohan ; Givot, Bradley L. ; Derzakowski, K.

  • Author_Institution
    Dept. of Electron. & Inf. Technol., Warsaw Univ. of Technol., Warsaw
  • fYear
    2008
  • fDate
    19-21 May 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Split post dielectric resonators have been used for measurements of the surface resistance of thin cermet and patterned metal films deposited on a thin low loss dielectric substrate.
  • Keywords
    dielectric resonators; surface resistance; thin films; dielectric substrates; metal film deposition; split post dielectric resonator technique; surface resistance measurements; thin cermet; thin resistive film measurements; Conductive films; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Dielectric substrates; Dielectric thin films; Electrical resistance measurement; Permittivity; Q factor; Surface resistance; Surface resistance; cermet resistors; thin metal films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwaves, Radar and Wireless Communications, 2008. MIKON 2008. 17th International Conference on
  • Conference_Location
    Wroclaw
  • Print_ISBN
    978-83-906662-8-0
  • Type

    conf

  • Filename
    4630320
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=476645