Title :
Integrated reliability and prognostics prediction methodology for power electronic modules
Author :
Bailey, Christopher ; Lu, Haw-minn ; Yin, C ; Tilford, T
Author_Institution :
University of Greenwich, UK
Abstract :
The article consists of a Powerpoint presentation on integrated reliability and prognostics prediction methodology for power electronic modules. The areas discussed include: power electronics flagship; design for reliability; IGBT module; design for manufacture; power module components; reliability prediction techniques; failure based reliability; etc.
Keywords :
design for manufacture; failure analysis; insulated gate bipolar transistors; power bipolar transistors; semiconductor device reliability; IGBT module; design for manufacture; design-for-reliability; failure based reliability; power electronic modules; power module components; prognostics prediction methodology; reliability prediction techniques;
Conference_Titel :
Aircraft Health Management for New Operational and Enterprise Solutions, 2008 IET Seminar on
Conference_Location :
London
Print_ISBN :
978-0-86341-936-2
